Welcome:Shenzhen Bonad Instrument Company Limited
IP2X Ingress Protection Test Jointed Finger with a Force of 10N
IEC 60335 Electrical Contact Indicator for Test Finger Probe
IEC60529 IP2X 12mm 80mm Long Jointed Test Finger with Force 50N
IEC60529 IP1X 50mm Sphere Access Probe with Test Force 50N
2.5mm Diameter Test Rod for IEC 60529 IP3X Testing
IEC 61032 IP2X Articulated Finger Test Probe B
IP20 12.5mm 30N 50N Rigid Sphere Probe for Foreign Objects Protection
1.0mm IP4X IP40 Test Wire Access Probe As Per IEC60529
IEC61032 IP10 Access Test Probe A with Sphere 50mm Diameter
Test Probes Kits List of IEC61032 BND-TPK07
EN IEC 60950 Test Probe Kits BND-TPK01
IEC 60601 Test Probe Kits BND-TPK02
Contact: Robin Zhou
Phone: +86 13352924160
E-mail: robin@szbonad.com
Whatsapp:+86 13352924160
Add: C505 Hongdu Building, Zone 45 , Baoan District, Shenzhen City, 518100, China
We chat